Scanning Electron Microscope Bench Top
Order Code: 23246533.36
Category: General Lab Equipment I
1. Beam energy 1- 30 kv, 2. Magnification up to 50 000x, 3. Resolution 15 nm, 4. With 3 -stage controls and dual imaging detectors, 5. Low vacuum capability for non-conductive samples, variable spot size control, optimal x-ray generation for EDS ...
SPECIFICATION
1. Beam energy 1- 30 kv,
2. Magnification up to 50 000x,
3. Resolution 15 nm,
4. With 3 -stage controls and dual imaging detectors,
5. Low vacuum capability for non-conductive samples, variable spot size control, optimal x-ray generation for EDS analysis, Backscatter (BSE) and Secondary (SE) detector.
6. EDS elemental analysis.
7. Antivibration table.
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