55960 Resistivity and Band Gap Measurement of Semiconductor is a versatile and useful training system for Physics and basic Electronics laboratories. In 55960, Band Gap can be measured by using Four Probe method. This is one of the most widely used method for measuring the Resistivity and Band Gap of semiconductors in which a collinear four-probe arrangement has been used. In this system, we provide pressure contacts with sample to take quick measurement at different positions. The setup is equipped with microcontroller based display for simultaneous measurement of voltage, current and temperature. Computer interfacing helps in automatic calculations and analysis.

Features

1. A complete setup for measuring the Resistivity and Band Gap
2. Four individually spring loaded probe arrangement
3. Collinear and equally spaced probes
4. LCD display
5. Probes are mounted on a Teflon bush, which ensure a good electrical insulation
6. PC Interfacing using USB/RS232 ports and supporting software
7. Sample-Germanium crystal

Object

1. Determination of Resistivity and Band Gap of Semiconductors by Four Probe Method at different temperatures.

Technical Specifications

Four Probes

• Contacts : Spring loaded
• Space between Probes : 2 mm ±2%
• Probes : Collinear

Sample

• Material : Germanium crystal

Oven

• Maximum Temperature : Ambient to 150 °C
• Heater Resistance : 45O
• Heater Voltage : 50V AC
• Temperature Sensor : LM35 (0 to 150 °C)

Measurement Unit

• Display : LCD 16 x 2 characters
• Measuring Parameter : Current, voltage, temperature simultaneously

Constant Current Generator

• Current Range : 0 to 15mA (approximately)
• Resolution : 1mA
• Open Circuit Voltage : 18V
• Power Supply : 230V AC, 50Hz